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Scanning Electron Microscope
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MODEL RELEASED. Scanning electron microscope with X-ray capability. Laboratory technician using a scanning electron microscope (SEM) to compare bullet score marks. This piece of equipment uses an electron beam to obtain a three-dimensional image of an object. The beam is scanned over the sample in a vacuum, causing the emission of secondary electrons. These secondary electrons are detected and used to form an image that is displayed on the screen. This SEM is equipped with a Voyager X-ray Quantitative Microanalysis System with digital imaging. This provides information on near-surface elemental analysis, X- ray maps and line scans. Elements detected are from carbon to heavier elements in the Periodic Table.
May 11th, 2013
Viewed 37 Times - Last Visitor from Beverly Hills, CA on 12/19/2014 at 6:12 PM
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